有机薄膜的表征

Preface to the Reissue of the Materials Characterization Series

Preface to Series

Preface to the Reissue of Characterization of Organic Thin Films

Preface

Contributors

PART 1 PREPARtITION AND MATERIALS

LANGMUIR-BLODGETT FILMS

1.1 Introduction

1.2 L-B Films ofLong-Chain Compounds

FattyAcids 6, Amines 8, OtherLong-ChainCompounds

1.3 CyclicCompoundsandChromophores

1.4 PolymersandProteins

1.5 PolymerizationInSitu

1.6 Alternation Films （Superlattices）

1.7 PotentiaIApplications

SELF-ASSEMBLED MONOIAYERS

2.1 Introduction

2.2 MonolayersofFattyAcids

2.3 MonolayersofOrganosiliconDerivatives

2.4 Monolayers ofAlkanethiolates on Metal and Semiconductor Surfaces

2.5 Self-Assembled Monolayers ContainingAromatic Groups

2.6 Conclusions

PART 2 ANALYSIS OF FILM AND SURFACE PROPERTIES

SPECTROSCOPIC ELLIPSOMETRY

3.1 Introduction and Overview

3.2 TheoryofEllipsometry

3.3 Instrumentation

3.4 DeterminationofOpticalProperties

Analysis of Single Ellipsometric Spectra: Direct Inversion Methods Analysis ofSingle Ellipsometric Spectra: Least- Squares RegressionAnalysis Method Analysis ofMultiple EllipsometricSpectra

3.5 Determination ofThin Film Structure

Thickness DeterminationforMonolayers Microstructural

Evolution in Thick Film Growth

3.6 Future Prospects

INFRARED SPECTROSCOPYIN THE CHARACTERIZATION OF ORGANIC THIN FILMS

4.1 Introduction

Specific Needs for Characterizing Organic Thin Films

General Prinaples and Capabilities oflnfrared Spectroscopy for

Surface and Thin Film Analysis

4.2 QuantitativeAspects

Spectroscopic Intensities Electromagnetic Fields in Thin

Film Structures

4.3 TheInfraredSpectroscopicExperiment

Generallnstrumentation 71, ExperimentaIModes

AdditionaIAspects

4.4 ExamplesofApplications

Self-Assembled Monolayers on Gold by External Reflection 81,

Octadecylsiloxane Monolayers on Si02 byTransmission 82,

Langmuir-Bfodgett Films on Nonmetallic Substrates by External

Reflection

RAMAN SPECTROSCOPIC CHARACTERIZATION OF ORGANIC THIN FILMS

5.1 Introduction

5.2 Fundamentals ofRaman Spectroscopy

……

Analytical tools for the study of organic thin films have seen dramatic developments in the last decade. Using such tools it has become possible to obtain structural information at the molecular level and thus to relate materials structure to materials properties. Characterization of Organic Thin Films will help materials scientists， physicists， chemists， and biologists develop a fundamental understanding of structure-properties relationships which in turn makes possible molecular engineering of advanced materials and opens new opportunities in molecular manufacturing. This volume begins with introductory chapters on Langmuir-Blodgett and self-assembled films， and continues with the discussion of their properties as studied by different analytical techniques. Both their surface/interfacial and bulk properties are covered.