光学材料的表征
光学材料的表征封面图

光学材料的表征

(美) 布伦德尔 (Brundle,C.R.) , (美) 埃文斯 (Evans,C.A.) , (美) 伊莎霍斯 (Exar,G.J.) , 主编

出版社:哈尔滨工业大学出版社

年代:2013

定价:78.0

书籍简介:

光学材料表征一书提供了关于在不同表征技术影响下理解光学材料的性能与特性方面的知识。表面与界面性质对材料的光响应是非常重要的,为实现所需性能在材料加工过程中对他们进行控制与修饰是必要的。光学材料表征一书集中介绍了表面形貌、微观结构及化学键是如何影响材料的光响应,它介绍了用于表征薄膜、多层结构与改性表面的方法。

书籍目录:

Preface to the Reissue ofthe Materials Characterization Series

Preface to Series

Preface to the Reissue of Characterization of Optical Materials

Preface

Contributors

INTRODUCTION

PART 1 INFLUENCE OF SURFACEMORPHOLOGYAND

MICROSTRUCTURE ON OPTICAL RESPONSE

CHARACTERIZATION OF SURFACE ROUGHNESS

1.1 Introduction

1.2 WhatSurfaceRoughnessls

1.3 HowSurfaceRoughness AffctsOpticaIMeasurements

1.4 How Surface Roughness and ScatteringAre Measured

1.5 Characterization ofSelected Surfaces

1.6 Future Difections

CHARACTERIZATION OF THE NEAR-SURFACE REGION USING POIARIZATION-SENSITIVE OPTICAL TECHNIQUES

2.1 Introduction

2.2 Ellipsometry

ExperimentallmplementationsofEllipsometry 29, Analysisof

EllipsometryData

2.3 MicrostructuralDeterminationsfromEllipsometryData

Temperature Dependence ofthe Opticat Properties ofSilicon 34,

Determination ofthe Optical Functions ofGlasses Using SE 35,

SpectroscopicEllipsometryStudiesofSi02/Si 37, Spectroscopic

EllipsometryforComplicatedFilmStrucrures 38, Time-Resolved

Ellipsometry 40, Single-WavelengthReal-TimeMonitoringofFilm

Growth 41, Multiple-WavelengthReal-TimeMonitoringofFilm

Growth 42, Infrared EllipsometryStudies ofFilm Growth

THE COMPOSITION, STOICHIOMETRY, AND RELATED MICROSTRUCTURE OF OPTICAL MATERIALS

3.1 Introduction

3.2 AspectsofRamanScattering

3.3 III-VSemiconductor Systems

3.4 GroupIVMaterials

3.5 Amorphous and Microcrystalline Semiconductors

ChalcogenideGlasses 60, GroupIVMicrocrystallineSemiconductors

3.6 Summary

DIAMOND AS AN OPTICAL MATERIAL

4.1 Introduction

4.2 DepositionMethods

4.3 0pticalPropertiesofCVD Diamond

4.4 Defectsin CVD Diamond

4.5 PolishingCVD Diamond

4.6 X-rayWindow

4.7 Summary

PART 2 STABILITY AND MODIFICATION OF FILM AND SURFACE OPTICAL PROPERTIES

MULTIJAYER OPTICAL COATINGS

5.1 Introduction

5.2 Single-LayerOpticalCoatings

OpticaIConstants 90, CompositionMeasurementTechniques

5.3 MultilayerOpticalCoatings

CompositionaIAnalysis 107, SurfaceAnalyticaITechniques 108,

MicrostructuralAnalysis ofMultilayer Optical Coatings

5.4 StabilityofMultilayerOpticalCoatings

5.5 Future Compositional and

MicrostructuralAnalyticaITechniques

CHARACTERIZATION AND CONTROL OF STRESS IN OPTICAL FILMS

6.1 Introduction

6.2 0rigins ofStress

……

内容摘要:

Characterization in Optica/ Materia/s provides information for understanding the properties and performance of optical materials under the influence of the various characterization techniques. Surface and interfacial properties are key to the optical response of a material, and their control and modification during materials processing is necessary to achieve desired behavior. Characterization of Optica/ Materia/s focuses on how surface morphology, microstructure, and chemical bonding influence the optical response of a material, and it illuminates methods used to characterize thin films, multilayer structures, and modified surfaces,

书籍规格:

书籍详细信息
书名光学材料的表征站内查询相似图书
丛书名材料表征原版系列丛书
9787560342795
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出版地哈尔滨出版单位哈尔滨工业大学出版社
版次1版印次1
定价(元)78.0语种英文
尺寸23 × 16装帧平装
页数印数

书籍信息归属:

光学材料的表征是哈尔滨工业大学出版社于2013.11出版的中图分类号为 TB34 的主题关于 光学材料-研究-英文 的书籍。